Kriti Patel
TLDR:
- Applied Rigaku Technologies has introduced the NEX CG II+ EDXRF spectrometer, offering advanced analytical capabilities.
- The NEX CG II+ features a high-power X-ray tube, secondary targets for trace-level sensitivity, and a large-area silicon drift detector.
Applied Rigaku Technologies has unveiled the NEX CG II+, a powerful benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer that offers non-destructive analysis of a wide range of elements. The key features of the NEX CG II+ include:
The NEX CG II+ is based on Rigaku’s NEX CG II model but features a 65 kV 100 W X-ray tube, providing increased sensitivity for demanding applications. This new spectrometer is ideal for trace element analysis in industries such as pharmaceuticals, cosmetics, and environmental monitoring.
With its advanced technology, the NEX CG II+ reinvents XRF with its high-power X-ray tube, secondary targets, and a large-area silicon drift detector. This combination results in exceptional sensitivity and low detection limits, making it suitable for a wide range of analytical applications.
The NEX CG II+ is equipped with user-friendly software, allowing for intuitive operation and analysis in multiple languages. The instrument also offers various automated sample changers, ensuring high-throughput measurements and simplified routine operations.
Overall, the NEX CG II+ is a powerful and versatile EDXRF spectrometer that offers advanced analytical capabilities and ease of use for a wide range of industries and applications. For more information about the NEX CG II+ and other models in the series, visit the Rigaku website.
